Teradyne derives no direct commercial benefit from propagating this standard, but we hope its usefulness, thoroughness, and full documentation will make all of us who work with ATE more productive.
Teradyne has adopted this standard for the test result output of all of its UNIX operating system based testers, and offers conversion software for users of its Test System Director for our other semiconductor test systems. It is our hope that both users and manufacturers of semiconductor ATE will find this standard useful, and will incorporate it into their own operations and products. Called the Standard Test Data Format (STDF ), its specification is contained in the following document.
In order to help overcome this problem, Teradyne has developed a simple, flexible, portable data format to which existing data files and formats can be easily and economically converted. A glaring hole in these standards has been the lack of test result data compatibility between test systems of different manufacturers, and sometimes within the product lines of a single manufacturer.
Many of these networking systems are converging on popular standards, such as Ethernet. Introduction to STDF Teradyne s Use of the STDF Specification STDF Design Objectives STDF Record Structure STDF Record Header Record Types and Subtypes Data Type Codes and Representation Note on Time and Date Usage Optional Fields and Missing/Invalid Data Note on Initial Sequence Alphabetical Listing File Attributes Record (FAR) 16 Audit Trail Record (ATR) 17 Master Information Record (MIR) 18 Master Results Record (MRR) 21 Part Count Record (PCR) 22 Hardware Bin Record (HBR) 23 Software Bin Record (SBR) 25 Pin Map Record (PMR) 27 Pin Group Record (PGR) 29 Pin List Record (PLR) 30 Retest Data Record (RDR) 32 Site Description Record (SDR) 33 STDF Specification V4 Page iĢ Table of Contents Wafer Information Record (WIR) 35 Wafer Results Record (WRR) 36 Wafer Configuration Record (WCR) 38 Part Information Record (PIR) 40 Part Results Record (PRR) 41 Test Synopsis Record (TSR) 43 Parametric Test Record (PTR) 45 Multiple-Result Parametric Record (MPR) 51 Functional Test Record (FTR) 55 Begin Program Section Record (BPS) 60 End Program Section Record (EPS) 61 Generic Data Record (GDR) 62 Datalog Text Record (DTR) 64 STDF Filenames STDF File Ordering Storing Repair Information Using the Pin Mapping Records Differences Between STDF V3 and V4 Record Types Data Types Filename Characters Required Records Changes to Specific Glossary STDF Specification V4 Page iiģ Introduction to STDF Introduction to STDF As the ATE industry matures, many vendors offer networking systems that complement the test systems themselves and help customers get more out of their ATE investment. 1 Standard Test Data Format (STDF) Specification Version 4 Table of Contents Click on any entry.
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